Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components
€176.00
Amendment 13 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
€88.00
Amendment 14 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
€44.00
Amendment 15 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
€22.00
Radiation protection instrumentation. In vivo counters. Classification, general requirements and test procedures for portable, transportable and installed equipment
€374.00
Amendment 12 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
Semiconductor devices - Part 1: General
€325.00
Semiconductor devices - Mechanical and climatic test methods - Part 33 : accelerated moisture resistance - unbiased autoclave - Dispositifs à semiconducteurs
€70.33
Semiconductor devices - Mechanical and climatic test methods - Part 24 : accelerated moisture resistance - Unbiased HAST - Dispositifs à semiconducteurs
€25.33
Teleweb application Superteletext profile
€404.00
Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave
€41.00
Semiconductor devices - Mechanical and climatic test methods -- Part 24: Accelerated moisture resistance - Unbiased HAST
€48.00
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
€51.00
Amendment 11 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST (IEC 60749-24:2004); German version EN 60749-24:2004
€63.27
