31.080.01 : Semiconductor devices in general

NF EN 60749-24, C96-022-24 (12/2005)

NF EN 60749-24, C96-022-24 (12/2005)

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Semiconductor devices - Mechanical and climatic test methods - Part 24 : accelerated moisture resistance - Unbiased HAST - Dispositifs à semiconducteurs

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VDA EOS-Electrical Overstress in der Automobilindustrie

VDA EOS-Electrical Overstress in der Automobilindustrie

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EOS-Electrical Overstress in the Automotive Industry, Dealing with semiconductor devices showing a signature of electrial overstress, Contents, documentations and explanations 1st Edition, January 2020

€46.25

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