Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits - Sixth supplement
€11.00
Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
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Semiconductor devices; amendment to IEC 60747-11: sectional specification for discrete semiconductor devices (IEC 47(Secretariat)1318:1993)
€41.78
Amendment 2 - Semiconductor devices - Discrete devices and integrated circuits - Part 1: General
€286.00
Amendment 2 - Semiconductor devices. Integrated circuits. Part 1: General
€22.00
Amendment 2 - Semiconductor devices - Mechanical and climatic test methods.
€88.00
Semiconductor devices; assessment of quality levels in PPM; identical with IEC 47(Central Office)1338:1992
€34.30
Semiconductor devices; pulse concepts and input-to-output pulse switching times; identical with IEC 47(Central Office)1315:1992
€48.79
Convertisseurs à semiconducteur - Spécifications communes et convertisseurs commutés par le réseau - Partie 1-1 : spécifications des clauses techniques de base.
€166.50
Convertisseurs à semiconducteurs - Spécifications communes et convertisseurs commutés par le réseau - Partie 1-3 : transformateurs et bobines d'inductance.
€77.67
Semiconductor devices; list of recommended subscripts in IEC 60747-1, partial revision; identical with IEC 47(Secretariat)1284
€56.17
Electrostatic sensitive semiconductor devices sensitive to voltage pulses of short duration; test methods; identical with IEC 47(Central Office)1246
Semiconductor devices; new and revised terms and definitions; identical with IEC 47/1(IEV 521)(Central Office)1253/1320
€77.20
Semiconductor devices; resistance of semiconductor SMDs to the combined effect of moisture and soldering heat; identical with IEC 47(Central Office)1316
SEMICONDUCTOR DEVICES. MECHANICAL AND CLIMATIC TEST METHODS.
€73.00
