ELECTROTECHNICAL VOCABULARY. SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS.
€96.00
Guide for The Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
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Amendment 1 - Semiconductor devices - Mechanical and climatic test methods.
€127.00
Semiconductor devices; drift and instability; terms and definitions; identical with IEC 47(Central Office)1221
€34.30
Amendment 1 - Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices
€11.00
Semiconductor devices; amendment of IEC 60749 climatic-mechanical test methods; new clause 7: mechanical test methods for SMD devices; identical with IEC 47(Secretariat)1227
€41.78
Semiconductor devices; amendment of testgroups B5, C5 and C7 of IEC 747-11; identical with IEC 47(Central Office)1187
Amendment 1 - Semiconductor devices - Discrete devices and integrated circuits - Part 1: General
Semiconductor devices; measurement of coplanarity of the leads; identical with IEC 47(Central Office)1230
IEC-Q-quality assessment system for electronic components; capability approval procedure; identical with IEC 47(Central Office)1117
€56.17
Semiconductor devices; rules for the indication of the polarity of currents and voltages; identical with IEC 47/47A(Central Office)1127/214
Semiconductor devices; amendment to IEC 60749: gross leak test; identical with IEC 47(Central Office)1169
Semiconductor devices; amendment to IEC 60749; external visual inspection; identical with IEC 47(Central Office)1170
Semiconductor devices; sealing test Q for semiconductor devices; identical with IEC 47(Central Office)1186
Amendment 1 - Semiconductor devices. Integrated circuits. Part 1: General
