Standard Test Method for Determining the Average Electrical Width of a Straight, Thin-Film Metal Line [Metric]
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Amendment 2 - Mechanical standardization of semiconductor devices. Part 3: General rules for the preparation of outline drawings of integrated circuits
€11.00
Seventeenth supplement
Sixteenth supplement
€231.00
GRAPHICAL SYMBOLS FOR DIAGRAMS. SEMICONDUCTORS AND ELECTRON TUBES.
€77.00
Pin 1 mark for identification in automatic handling systems (IEC 47D/53/CD:1994)
€41.78
Amendment 1 - Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
Amendment 3 - Semiconductor devices. Integrated circuits. Part 1: General
Standard Practice for Testing for Leaks Using the Halogen Leak Detector (Alkali-Ion Diode)
Standard Practice for Testing for Leaks Using the Halogen Leak Detector(Alkali-Ion Diode) (Withdrawn 2013)
Standard Test Method for Radiologic Examination of Semiconductors and Electronic Components
MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES. PART 4: CODING SYSTEM AND CLASSIFICATION INTO FORMS OF PACKAGE OUTLINES FOR SEMICONDUCTOR DEVICES.
€36.00
Semiconductor devices - Visual inspection of discrete semiconductor devices (IEC 47E(Secretariat)6:1994)
€214.30
Semiconductor devices; amendments of the rules for subscripts and indication of polarity (IEC 47(Central Office)1336:1992)
€34.30
Semiconductor devices; protections of electrostatic-sensitive devices (IEC 47(Secretariat)1330:1993)
€105.42
