Superseded
Draft standard
Historical
DIN IEC 47(Sec)1227:1991-10
Semiconductor devices; amendment of IEC 60749 climatic-mechanical test methods; new clause 7: mechanical test methods for SMD devices; identical with IEC 47(Secretariat)1227
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Summary
Halbleiterbauelemente; Ergänzung der IEC 60749 klimatisch mechanische Prüfungen; Neuer Abschnitt 7: Mechanische Prüfungen für SMD-Bauelemente; Identisch mit IEC 47(Sec)1227
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 10/01/1991 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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