Semiconductor devices; revision of the definition for forward direction and reverse direction; identical with IEC 47(Central Office)1120
€34.30
Semiconductor devices; cut-off-frequency, terms and definitions; identical with IEC 47(Central Office)1121
Semiconductor devices; revision of IEC 60747-1, chapter IV, 2.16 layers; identical with IEC 47(Central Office)1122
Semiconductor devices; differential resistance (between two terminals), definition and letter symbol; identical with IEC 47(Central Office)1124
Semiconductor devices; revision of IEC 60747-1, chapters IV, V and VI, clauses on thermal characteristics and related temperatures; identical with IEC 47(Central Office)1126
Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
€325.00
Standard Test Method for Calibration of Helium Leak Detectors by Use of Secondary Standards (Withdrawn 2008)
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Dispositifs hyperfréquences - Lignes à retard actives - Éléments entrant dans la définition des procédés technologiques pour l'agrément de savoir-faire et recueil de spécifications particulières
€95.67
Mechanical standardization of semiconductor devices. Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages
€127.00
Dispositifs hyperfréquences - Relais et commutateurs électromécaniques coaxiaux et en guides d'ondes - Recueil de spécifications particulières
€43.67
Specification for microprocessor universal format object modules
€269.00
Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits - Fifth supplement
€22.00
Specification for binary floating point arithmetic for microprocessor systems
€193.00
Semiconductor devices; mechanical and climatic test methods, internal moisture content; identical with IEC 47(Central Office)1085
fifteenth complement
€286.00
