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IEC 60747-10:1991
Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
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Summary
It is a generic specification for semiconductor devices, discrete
devices and integrated circuits, including multichip integrated
circuits, but excluding hybrid circuits.
It defines general procedures for quality assessment to be used in
the IECQ System and gives general rules for measuring methods of
electrical characteristics, climatic and mechanical tests, and
endurance tests.
devices and integrated circuits, including multichip integrated
circuits, but excluding hybrid circuits.
It defines general procedures for quality assessment to be used in
the IECQ System and gives general rules for measuring methods of
electrical characteristics, climatic and mechanical tests, and
endurance tests.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 05/21/1991 |
| Release Date | 05/21/1991 |
| Cancellation Date | 12/31/2015 |
| Edition | 2 |
| Page Count | 86 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
21/05/1991
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