Superseded
Standard amendment
Historical
IEC 60749:1984/AMD2:1993
Amendment 2 - Semiconductor devices - Mechanical and climatic test methods.
Preview
No description.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 09/21/1993 |
| Release Date | 09/21/1993 |
| Cancellation Date | 10/28/1996 |
| Edition | 1 |
| Page Count | 31 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
No products.
Previous versions
20/12/1991
Superseded
Historical
31/07/2000
Superseded
Historical
IEC 60749:1984/AMD2:1993
Amendment 2 - Semiconductor devices - Mechanical and climatic test methods.
21/09/1993
Superseded
Historical
17/10/2001
Superseded
Historical
30/12/1984
Superseded
Historical
28/10/1996
Superseded
Historical
10/04/2002
Superseded
Historical
No products.