Superseded
Standard
Historical
IEC 60749:1996+AMD1:2000+AMD2:2001 Consolidated
Semiconductor devices - Mechanical and climatic test methods
Preview
Summary
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made.
Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.
Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 04/10/2002 |
| Release Date | 04/10/2002 |
| Cancellation Date | 07/31/2004 |
| Edition | 2.2 |
| Page Count | 151 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
20/12/1991
Superseded
Historical
31/07/2000
Superseded
Historical
21/09/1993
Superseded
Historical
17/10/2001
Superseded
Historical
30/12/1984
Superseded
Historical
28/10/1996
Superseded
Historical
10/04/2002
Superseded
Historical
No products.