Superseded
Standard
Historical
IEC 60749:1996
Semiconductor devices - Mechanical and climatic test methods
Preview
Summary
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 10/28/1996 |
| Release Date | 10/28/1996 |
| Cancellation Date | 03/15/2004 |
| Edition | 2 |
| Page Count | 95 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
20/12/1991
Superseded
Historical
31/07/2000
Superseded
Historical
21/09/1993
Superseded
Historical
17/10/2001
Superseded
Historical
30/12/1984
Superseded
Historical
28/10/1996
Superseded
Historical
10/04/2002
Superseded
Historical
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