IEC 60749:1996/AMD1:2000
Superseded Standard amendment
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IEC 60749:1996/AMD1:2000

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods
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Publisher International Electrotechnical Commission (IEC)
Publication Date 07/31/2000
Release Date 07/31/2000
Cancellation Date 07/31/2004
Edition 2
Page Count 21
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ISBN ---
Weight (in grams) ---
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