Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage (IEC 60749-42:2014); German version EN 60749-42:2014
€63.27
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates (IEC 47/2224/CD:2015)
€84.58
Semiconductor devices - Micro-electromechanical devices - Part 27: Bond strength test for glass frit bonded structures using micro-chevron-tests (MCT) (IEC 47F/216/CD:2015)
€91.03
Semiconductor devices - Micro- electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin film (IEC 47F/78/CD:2011)
€111.40
Semiconductor devices - Micro-electromechanical devices - Part 18: Bending test methods of thin film materials (IEC 47F/76/CD:2011)
€69.91
Composants hyperfréquences - Caractéristiques dimensionnelles - Recueil de feuilles de boîtiers relatifs aux composants hyperfréquences
€95.67
RECOMMENDED GRAPHICAL AND LITERAL SYMBOLS. SEMICONDUCTORS DEVICES, CONDENSERS.
€59.00
MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES. PART 4: CODING SYSTEM AND CLASSIFICATION INTO FORMS OF PACKAGE OUTLINES FOR SEMICONDUCTOR DEVICES.
€35.00
Composants électroniques - Système CENELEC d'assurance de la qualité - Dispositifs discrets à semiconducteurs - Spécification générique.
€91.00
Microstructures - Microélectronique hyperfréquence - Mélangeurs de réception - Prescriptions générales.
€119.00
Microstructures - Microélectronique hyperfréquence - Détecteurs - Prescriptions générales.
€125.00
Microstructures - Microélectronique hyperfréquence - Mélangeurs de réception - Recueil de feuilles particulières.
€59.33
Semiconductor devices; assessment of quality levels in PPM; identical with IEC 47(Central Office)1338:1992
€34.30
Semiconductor devices; amendment to IEC 60747-11: sectional specification for discrete semiconductor devices (IEC 47(Secretariat)1318:1993)
€41.78
Electrostatic sensitive semiconductor devices sensitive to voltage pulses of short duration; test methods; identical with IEC 47(Central Office)1246
