Semiconductor devices - Mechanical and climatic test methods -- Part 22: Bond strength
€69.00
Semiconductor devices - Mechanical and climatic test methods -- Part 36: Acceleration, steady state
€36.00
Semiconductor devices - Mechanical and climatic test methods -- Part 31: Flammability of plastic-encapsulated devices (internally induced)
€32.00
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
€44.00
Normalisation mécanique des dispositifs à semiconducteurs - Partie 6-10 : règles générales pour la préparation des dessins d'encombrement des dispositifs à semiconducteurs pour montage en surface - Dimensions des boîtiers P-VSON
€77.67
Semiconductor devices - Mechanical and climatic test methods - Part 14 : robustness of terminations (lead integrity) - Dispositifs de semiconducteurs
€95.67
Semiconductor devices. Mechanical and climatic test methods Robustness of terminations (lead integrity)
€193.00
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state (IEC 60749-36:2003); German version EN 60749-36:2003.
€41.78
Semiconductor devices - Mechanical and climatic test methods - Part 1: General (IEC 60749-1:2002 + Corr. 1:2003); German version EN 60749-1:2003.
€56.17
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic encapsulated devices (internally induced) (IEC 60749-31:2002 + Corr. 1:2003); German version EN 60749-31:2003.
€34.30
Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength (IEC 60749-22:200 + Corr. 1:2003); German version EN 60749-22:2003.
€91.03
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing (IEC 60749-8:2002 + Corr. 1:2003 + Corr. 2:2003); German version EN 60749-8:2003.
€84.58
Semiconductor devices - Mechanical and climatic test methods - Part 25 : temperature cycling - Dispositifs de semiconducteurs
€52.00
Semiconductor devices. Mechanical and climatic test methods. Part 16: Particle impact noise detection (PIND)
€48.00
