Semiconductor devices; measurement of coplanarity of the leads; identical with IEC 47(Central Office)1230
€34.30
IEC-Q-quality assessment system for electronic components; capability approval procedure; identical with IEC 47(Central Office)1117
€56.17
Semiconductor devices; rules for the indication of the polarity of currents and voltages; identical with IEC 47/47A(Central Office)1127/214
€41.78
Semiconductor devices; amendment to IEC 60749: gross leak test; identical with IEC 47(Central Office)1169
Semiconductor devices; amendment to IEC 60749; external visual inspection; identical with IEC 47(Central Office)1170
Semiconductor devices; sealing test Q for semiconductor devices; identical with IEC 47(Central Office)1186
Semiconductor devices; amendment of testgroups B5, C5 and C7 of IEC 747-11; identical with IEC 47(Central Office)1187
Semiconductor devices; amendment of IEC 60749 climatic-mechanical test methods; new clause 7: mechanical test methods for SMD devices; identical with IEC 47(Secretariat)1227
Semiconductor devices; drift and instability; terms and definitions; identical with IEC 47(Central Office)1221
Semiconductor devices letter symbols for the logarithmic scale unit "decibel"; identical with IEC 47(Central Office)1319
Semiconductor devices; concepts for element of semiconductor devices and other related concepts; identical with IEC 47(Central Office)1223
Semiconductor devices; concepts and letter symbols for direct and alternating quantities; identical with IEC 47(Central Office)1224
Semiconductor devices; mechanical and climatic test method; internal moisture content measurement by mass spectrometry method; identical with IEC 47(Central Office)1252
Semiconductor devices; basic concepts defining the scope of TC 47; identical with IEC 47(Central Office)1220
IEC 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
€133.00
