Semiconductor devices; new and revised terms and definitions; identical with IEC 47/1(IEV 521)(Central Office)1253/1320
€77.20
Semiconductor devices; resistance of semiconductor SMDs to the combined effect of moisture and soldering heat; identical with IEC 47(Central Office)1316
€48.79
Semiconductor devices; list of recommended subscripts in IEC 60747-1, partial revision; identical with IEC 47(Secretariat)1284
€56.17
Semiconductor devices; pulse concepts and input-to-output pulse switching times; identical with IEC 47(Central Office)1315:1992
Semiconductor devices; mechanical and climatic test methods; supplements to IEC 749; damp heat; identical with IEC 47(Central Office)1054
€34.30
Semiconductor devices; terms and definitions for leakage current of analogue signal switching circuits; identical with IEC 47(Central Office)1108
Semiconductor devices; mechanical and climatic test methods, internal moisture content; identical with IEC 47(Central Office)1085
Semiconductor devices; revision of the definition for forward direction and reverse direction; identical with IEC 47(Central Office)1120
Semiconductor devices; cut-off-frequency, terms and definitions; identical with IEC 47(Central Office)1121
Semiconductor devices; revision of IEC 60747-1, chapter IV, 2.16 layers; identical with IEC 47(Central Office)1122
Semiconductor devices; differential resistance (between two terminals), definition and letter symbol; identical with IEC 47(Central Office)1124
Semiconductor devices; revision of IEC 60747-1, chapters IV, V and VI, clauses on thermal characteristics and related temperatures; identical with IEC 47(Central Office)1126
Semiconductor devices; terms and definitions for semiconductor pressure sensors; identical with IEC 47(Secretariat)1253
Semiconductor devices; destructive test; term and definition; identical with IEC 47(Secretariat)1234
Semiconductor devices; category of assessed quality; term and definition; identical with IEC 47(Secretariat)1246
