IEC 62779-1:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements
€133.00
IEC 62779-3:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions
€93.00
IEC 60749-44:2016 Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
€186.00
IEC 61975:2010/AMD1:2016 Amendment 1 - High-voltage direct current (HVDC) installations - System tests
IEC 60191-6-13:2016 Mechanical standardization of semiconductor devices - Part 6-13: Design guideline of open-top-type sockets for Fine-pitch Ball Grid Array (FBGA) and Fine-pitch Land Grid Array (FLGA)
Semiconductor devices; terminology; electrostatic-discharge-sensitive; identical with IEC 47(Central Office)1052
€34.30
Semiconductor devices; recovered charge; terminology; identical with IEC 47(Central Office)1077
Semiconductor devices; term and letter symbol for leakage current; identical with IEC 47(Central Office)1073
Semiconductor devices; internal visual examination; procedure for discrete semiconductors; identical with IEC 47(Central Office)1053
€56.17
Semiconductor devices; internal visual examination; procedure for discrete semiconductors; identical with IEC 47(Central Office)1053-II
€77.20
Semiconductor devices; mechanical and climatic test methods; amendment to IEC 60749; identical with IEC 47(Central Office)1084
Semiconductor devices; amendment to the generic specification; IEC 60747-10/QC 700000; identical with IEC 47(Central Office)1092
Semiconductor devices; amendment to the generic specification IEC 60747-10; accelerated test procedures; identical with IEC 47/47A(Central Office)1116/205
Harmonized system of quality assessment for electronic components: Discrete semiconductor devices
€122.34
Semiconductor devices - Discrete devices and integrated circuits - Thyristors; Identical with CEI 747-6, edition 1983
€167.66
