Active
Standard
Most Recent
DIN EN 60749-2:2003-04
Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure (IEC 60749-2:2002); German version EN 60749-2:2002.
Preview
Summary
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 2: Niedriger Luftdruck (IEC 60749-2:2002); Deutsche Fassung EN 60749-2:2002 / Achtung: Daneben gilt DIN EN 60749 (2002-09) unter besonderen Bedingungen noch bis 2005-07-01.
Notes
Under certain conditions, DIN EN 60749 (2002-09) remains valid alongside this standard until 2005-07-01.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 04/01/2003 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
No products.
Previous versions
No products.