Semiconductor optoelectronic devices for fibre optic system applications - Part 2 : measuring methods
€107.33
Semiconductor devices. Mechanical and climatic test methods Handling, packing, labelling shipping of surface-mount devices sensitive to the combined effect moisture soldering heat
€316.00
Semiconductor devices - Mechanical and climatic test methods - Part 20-1 : handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat - Dispositifs à semiconducteurs
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
€269.00
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory (IEC 60749-38:2008); German version EN 60749-38:2008
€63.27
Corrigendum 1 - Semiconductor devices - Part 1: General
€0.00
Semiconductor devices. Mechanical and climatic test methods Soft error method for semiconductor devices with memory
€193.00
Semiconductor devices - Mechanical and climatic test methods - Part 38 : soft error test method for semiconductor devices with memory - Dispositifs à semiconducteurs
€95.67
Amendment 17 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
€22.00
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
€88.00
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films (IEC 62374:2007); German version EN 62374:2007
€105.42
Semiconductor devices Microwave integrated circuits. Frequency prescalers
Semiconductor devices - Part 16-2: Microwave integrated circuits - Frequency prescalers
€413.00
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films - Dispositifs à semiconductors
€111.67
Amendment 1 - Semiconductor devices - Part 16-2: Microwave integrated circuits - Frequency prescalers
€11.00
