Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
€32.00
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
€36.00
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength (IEC 60749-19:2003 + A1:2010); German version EN 60749-19:2003 + A1:2010.
€56.17
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced) (IEC 60749-32:2002 + Cor. :2003 + A1:2010); German version EN 60749-32:2003 + Cor. :2003 + A1:2010.
Mechanical standardization of semiconductor devices General rules for the preparation outline drawings surface mounted device packages. Measuring methods package dimensions small J-lead packages (SOJ)
€193.00
Mechanical standardization of semiconductor devices General rules for the preparation outline drawings surface mounted device packages. Measuring methods package dimensions small packages (SOP)
Semiconductor devices - Constant current electromigration test (IEC 62415:2010); German version EN 62415:2010
€77.20
Semiconductor devices - Metallization stress void test (IEC 62418:2010); German version EN 62418:2010
€98.32
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
€55.00
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
Dispositifs à semiconducteurs - Essai d'électromigration en courant constant
€77.67
Normalisation mécanique des dispositifs à semiconducteurs - Partie 6-19 : méthodes de mesure du gauchissement des boîtiers à température élevée et du gauchissement maximum admissible
€95.67
Semiconductor devices. Mechanical and climatic test methods Die shear strength
€165.00
Mechanical standardization of semiconductor devices General rules for the preparation outline drawings surface mounted device packages. Design guide ball grid array (BGA)
€269.00
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
€44.00
