31.080.01 : Semiconductor devices in general

NF EN 60191-6-3, C96-013-6-3 (04/2001)

NF EN 60191-6-3, C96-013-6-3 (04/2001)

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Mechnical standardization of semiconductor devices - Part 6-3 : general rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of quad flat packs (QFP)

€86.33

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NF C96-036 (01/1992) (R2012)

NF C96-036 (01/1992) (R2012)

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Binary floating-point arithmetic for microprocessor systems.

€95.67

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NF C96-318 (03/1991)

NF C96-318 (03/1991)

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Dispositifs hyperfréquences - Lignes à retard actives

€77.67

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UTE C96-315/A2, C96-315/A2U (11/1990)

UTE C96-315/A2, C96-315/A2U (11/1990)

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Additif 2 à la publication UTE C 96-315 de décembre 1988

€65.33

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NF EN 61975/A1, C53-975/A1 (04/2017)

NF EN 61975/A1, C53-975/A1 (04/2017)

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High-voltage direct current (HVDC) installations - System tests

€111.67

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NF EN IEC 60191-1, C96-013-1 (03/2018)

NF EN IEC 60191-1, C96-013-1 (03/2018)

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Normalisation mécanique des dispositifs à semi-conducteurs - Partie 1 : règles générales pour la préparation des dessins d'encombrement des dispositifs discrets

€131.33

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NF EN IEC 60749-17, C96-022-17 (05/2019)

NF EN IEC 60749-17, C96-022-17 (05/2019)

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Semiconductor devices - Mechanical and climatic test methods - Part 17 : neutron irradiation

€77.67

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NF EN IEC 60749-18, C96-022-18 (05/2019)

NF EN IEC 60749-18, C96-022-18 (05/2019)

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Semiconductor devices - Mechanical and climatic test methods - Part 18 : Ionizing radiation (total dose)

€111.67

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NF EN IEC 62435-4, C96-435-4 (08/2018)

NF EN IEC 62435-4, C96-435-4 (08/2018)

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Electronic components - Long-term storage of electronic semiconductor devices - Part 4 : storage

€111.96

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NF EN IEC 62435-3, C96-435-3 (04/2020)

NF EN IEC 62435-3, C96-435-3 (04/2020)

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Electronic components - Long-term storage of electronic semiconductor devices - Part 3 : data - Composants électroniques - Stockage de longue durée des dispositifs électroniques à semiconducteurs - Partie 3 : Données.

€95.67

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NF EN IEC 60749-41, C96-022-41 (09/2020)

NF EN IEC 60749-41, C96-022-41 (09/2020)

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Semiconductor devices - Mechanical and climatic test methods - Part 41 : standard reliability testing methods of non-volatile memory devices

€111.67

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DIN EN 60749-27:2007-01

DIN EN 60749-27:2007-01

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Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006); German version EN 60749-27:2006.

€77.20

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DIN EN 62047-2:2007-02

DIN EN 62047-2:2007-02

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Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials (IEC 62047-2:2006); German version EN 62047-2:2006

€63.27

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DIN EN 62047-3:2007-02

DIN EN 62047-3:2007-02

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Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile-testing (IEC 62047-3:2006); German version EN 62047-3:2006

€56.17

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DIN EN 60749-35:2007-03

DIN EN 60749-35:2007-03

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Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35:2006); German version EN 60749-35:2006

€98.32

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