Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (IEC 60749-7:2011); German version EN 60749-7:2011.
€77.20
Semiconductor devices - Mechanical and climatic test methods - Part 40 : board level drop test method using a strain gauge - Dispositifs à semiconducteurs
€111.67
Semiconductor devices - Mechanical and climatic test methods - Part 7 : internal moisture content measurement and the analysis of other residual gases - Dispositifs à semiconducteurs
€52.00
Mechanical standardization of semiconductor devices - Part 6-12 : general rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for fine-pitch land grid array (FLGA)
€95.67
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 60749-29:2011); German version EN 60749-29:2011.
€111.40
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (IEC 60749-21:2011); German version EN 60749-21:2011.
€105.42
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
€32.00
Semiconductor die products - Part 2: Exchange data formats (IEC 62258-2:2011); English version EN 62258-2:2011.
€179.53
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films (IEC 62047-8:2011); German version EN 62047-8:2011
€98.32
Obsolescence electronic components - Rules concerning the treatment of product discontinuance and replacement - Obsolescence des composants électroniques
€77.67
Electronic equipment obsolescence - Guide applied obsolescence management - Obsolescence des équipements électroniques
€126.00
Amendment 18 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
€127.00
Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement the analysis of other residual gases
€193.00
Semiconductor devices. Mechanical and climatic test methods Board level drop method using a strain gauge
€269.00
Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 4 : spécification générique pour les MEMS
€82.00
