31.080.01 : Semiconductor devices in general

UTE C96-315, C96-315U (12/1988)

UTE C96-315, C96-315U (12/1988)

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Microcircuits. Microwave devices. Attenuators. General article sheets. - Dispositifs hyperfréquences

€117.00

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UTE C96-315/A1, C96-315/A1U (02/1989)

UTE C96-315/A1, C96-315/A1U (02/1989)

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Additif 1 à la publication UTE C 96-315 de décembre 1988

€141.33

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NF EN 60749-8, C96-022-8 (11/2003)

NF EN 60749-8, C96-022-8 (11/2003)

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Semiconductor devices - Mechanical and climatic test methods - Part 8 : sealing - Dispositifs à semiconducteurs

€95.67

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NF EN 60749-22, C96-022-22 (11/2003)

NF EN 60749-22, C96-022-22 (11/2003)

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Semiconductor devices - Mechanical and climatic test methods - Part 22 : bond strength - Dispositifs à semiconducteurs

€95.67

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NF EN 60749-31, C96-022-31 (11/2003)

NF EN 60749-31, C96-022-31 (11/2003)

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Semiconductor devices - Mechanical and climatic test methods - Part 31 : flammability of plastic-encapsulated devices (internally induced) - Dispositifs à semiconducteurs

€43.67

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NF EN 60749-32, C96-022-32 (11/2003)

NF EN 60749-32, C96-022-32 (11/2003)

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Semiconductor devices - Mechanical and climatic test methods - Part 32 : flammability of plastic-encapsulated devices (externally induced) - Dispositifs à semiconducteurs

€28.00

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NF EN 60749-30, C96-022-30 (06/2005)

NF EN 60749-30, C96-022-30 (06/2005)

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 30 : preconditioning of non-hermetic surface mount devices prior to reliability testing - Dispositifs à semiconducteurs

€74.00

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NF EN 62258-6, C96-034-6 (12/2006)

NF EN 62258-6, C96-034-6 (12/2006)

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Semiconductor die products - Part 6 : requirements for information concerning thermal simulation

€62.50

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NF EN 60749-39, C96-022-39 (12/2006)

NF EN 60749-39, C96-022-39 (12/2006)

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 39 : measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components - Dispositifs à semiconducteurs

€59.33

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NF EN 60749-37, C96-022-37 (07/2008)

NF EN 60749-37, C96-022-37 (07/2008)

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 37 : board level drop test method using an accelerometer - Dispositifs à semiconducteurs

€111.67

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NF EN 60191-4, C96-013-4 (09/2000)

NF EN 60191-4, C96-013-4 (09/2000)

Superseded Historical

Mechanical standardization of semiconductor devices - Part 4 : coding system and classification into forms of package outlines for semiconductor device packages

€96.59

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NF EN 60191-6-16, C96-013-6-16 (01/2013)

NF EN 60191-6-16, C96-013-6-16 (01/2013)

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Normalisation mécanique des dispositifs à semiconducteurs - Partie 6-16 : glossaire des supports de test et de déverminage pour les BGA, LGA, FBGA et FLGA

€77.67

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NF EN 62374, C96-017 (01/2008)

NF EN 62374, C96-017 (01/2008)

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Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films - Dispositifs à semiconductors

€87.39

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NF EN 60749-35, C96-022-35 (12/2006)

NF EN 60749-35, C96-022-35 (12/2006)

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Semiconductor devices - Mechanical and climatic test methods - Part 35 : acoustic microscopy for plastic encapsulated electronic components - Dispositifs à semiconducteurs

€95.67

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NF EN 60617-5, C03-205 (03/1997)

NF EN 60617-5, C03-205 (03/1997)

Withdrawn Most Recent

Graphical symbols for diagrams. Part 5 : semiconductors and electron tubes. - GRAPHISCHE SMBOLE FUER SCHALTPLAENE. TEIL 5 : SCHALTZEICHEN FUER HALBLEITER UND ELEKTRONENROEHREN. (EUROPAEISCHE NORM EN 60 617-5).

€143.80

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