31.080.01 : Semiconductor devices in general

DIN EN 62047-26:2016-12

DIN EN 62047-26:2016-12

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Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures (IEC 62047-26:2016); German version EN 62047-26:2016

€116.64

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DIN EN 62047-1:2016-12

DIN EN 62047-1:2016-12

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Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions (IEC 62047-1:2016); German version EN 62047-1:2016.

€128.22

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NF EN 60749-44, C96-022-44 (12/2016)

NF EN 60749-44, C96-022-44 (12/2016)

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Semiconductor devices - Mechanical and climatic test methods - Part 44 : neutron beam irradiated single event effect (SEE) test method for semiconductor devices

€111.67

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BS EN 60749-44:2016

BS EN 60749-44:2016

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Semiconductor devices. Mechanical and climatic test methods Neutron beam irradiated single event effect (SEE) method for semiconductor devices

€269.00

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IEC 60191-6-13:2016

IEC 60191-6-13:2016

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Mechanical standardization of semiconductor devices - Part 6-13: Design guideline of open-top-type sockets for Fine-pitch Ball Grid Array (FBGA) and Fine-pitch Land Grid Array (FLGA)

€127.00

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IEC 61975:2010/AMD1:2016

IEC 61975:2010/AMD1:2016

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Amendment 1 - High-voltage direct current (HVDC) installations - System tests

€127.00

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IEC 61975:2010+AMD1:2016 Consolidated

IEC 61975:2010+AMD1:2016 Consolidated

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High-voltage direct current (HVDC) installations - System tests

€924.00

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NF EN 62779-3 (09/2016)

NF EN 62779-3 (09/2016)

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Dispositifs à semiconducteurs - Interface à semiconducteurs pour les communications via le corps humain - Partie 3 : type fonctionnel et ses conditions d’utilisation

€65.33

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NF EN 62779-2 (08/2016)

NF EN 62779-2 (08/2016)

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Dispositifs à semiconducteurs - Interface à semiconducteurs pour les communications via le corps humain - Partie 2 : caractérisation des performances d'interfaçage

€82.00

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NF EN 62779-1 (08/2016)

NF EN 62779-1 (08/2016)

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Dispositifs à semiconducteurs - Interface à semiconducteurs pour les communications via le corps humain - Partie 1 : exigences générales

€82.00

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IEC 60749-44:2016

IEC 60749-44:2016

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Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

€176.00

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BS EN 62779-1:2016

BS EN 62779-1:2016

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Semiconductor devices. interface for human body communication General requirements

€193.00

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BS EN 62779-2:2016

BS EN 62779-2:2016

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Semiconductor devices. interface for human body communication Characterization of interfacing performances

€193.00

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BS EN 62779-3:2016

BS EN 62779-3:2016

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Semiconductor devices. interface for human body communication Functional type and its operational conditions

€193.00

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IEC 62779-3:2016

IEC 62779-3:2016

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Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions

€88.00

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