Composants pour parafoudres basse tension - Partie 322 : Principes de sélection et d'application pour les limiteurs de tension à jonction PN de semiconducteurs silicium
€125.00
Blank detail specification : ambient rated photocouplers with phototransistor output
€106.33
Semiconductor devices - Mechanical and climatic test methods - Part 12 : vibration, variable frequency
€59.33
Semiconductor devices - Mechanical and climatic test methods - Part 13 : salt atmosphere
€95.67
Mechanical standardization of semiconductor devices - Part 6-13 : design guideline of open-top-type sockets for fine-pitch ball grid array (FBGA) and fine-pitch land grid array (FLGA)
€85.42
Semiconductor devices - Mechanical and climatic test methods - Part 43 : guidelines for IC reliability qualification plans - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 43 : Directives concernant les plans de qualification de la fiabilité des CI
€138.00
Semiconductor devices - Mechanical and climatic test methods - Part 28 : Electrostatic Discharge (ESD) Sensitivity Testing - Direct contact charged device model (DC-CDM)
€158.33
Semiconductor devices - Mechanical and climatic test methods - Part 42 : temperature humidity storage - Dispositifs à semiconducteurs
€77.67
Semiconductor devices - Mechanical and climatic test methods - Part 27 : electrostatic discharge (ESD) sensivity testing - Machine model (MM) - Dispositifs à semiconducteurs
€43.67
Obsolescence electronic components - Rules concerning the treatment of product discontinuance and replacement - Obsolescence des composants électroniques
Electronic equipment obsolescence - Guide applied obsolescence management - Obsolescence des équipements électroniques
€126.00
Mechanical standardization of semiconductor devices - Part 6-22 : general rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for semiconductor packages Silicon Fine-pitch Ball Grid Array and Silicon Fine-pitch Land Grid Array (SFBGA and S-FLGA)
Semiconductor devices - Mechanical and climatic test methods - Part 23 : high temperature operating life - Dispositifs à semiconducteurs
€37.33
Semiconductor devices - Mechanical and climatic test methods - Part 33 : accelerated moisture resistance - unbiased autoclave - Dispositifs à semiconducteurs
€70.33
