Semiconductor devices. Scan based ageing level estimation for semiconductor devices
€193.00
Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices
€286.00
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination (IEC 60749-3:2017); German version EN 60749-3:2017.
€84.58
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
€22.00
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress (HAST)
Semiconductor devices. Mechanical and climatic test methods Permanence of marking
€165.00
Semiconductor devices. Mechanical and climatic test methods Storage at high temperature
Semiconductor devices. Mechanical and climatic test methods External visual examination
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (IEC 60749-4:2017); German version EN 60749-4:2017.
€77.20
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 60749-6:2017); German version EN 60749-6:2017.
€63.27
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking (IEC 60749-9:2017); German version EN 60749-9:2017.
Semiconductor devices - Scan based ageing level estimation for semiconductor devices
€127.00
Amendment 1 - International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
€11.00
Semiconductor devices - Stress migration test standard - Part 1: Copper stress migration test standard
€176.00
Semiconductor devices - Mechanical and climatic test methods - Part 5 : steady-state temperature humidity bias life test
€77.67
