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IEC TR 63133:2017
Semiconductor devices - Scan based ageing level estimation for semiconductor devices
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Summary
IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 10/11/2017 |
| Release Date | 10/11/2017 |
| Edition | 1 |
| Page Count | 17 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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