31.080.01 : Semiconductor devices in general

BS EN IEC 60749-17:2019

BS EN IEC 60749-17:2019

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Semiconductor devices. Mechanical and climatic test methods Neutron irradiation

€165.00

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NF EN IEC 60749-17, C96-022-17 (05/2019)

NF EN IEC 60749-17, C96-022-17 (05/2019)

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Semiconductor devices - Mechanical and climatic test methods - Part 17 : neutron irradiation

€77.67

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NF EN IEC 60749-18, C96-022-18 (05/2019)

NF EN IEC 60749-18, C96-022-18 (05/2019)

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Semiconductor devices - Mechanical and climatic test methods - Part 18 : Ionizing radiation (total dose)

€111.67

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IEC 60749-18:2019

IEC 60749-18:2019

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Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

€176.00

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IEC 60749-17:2019

IEC 60749-17:2019

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Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

€44.00

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BS IEC 62951-5:2019

BS IEC 62951-5:2019

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Semiconductor devices. Flexible and stretchable semiconductor devices Test method for thermal characteristics of flexible materials

€193.00

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IEC 60050-521:2002/AMD2:2018

IEC 60050-521:2002/AMD2:2018

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Amendment 2 - International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits

€11.00

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18/30383935 DC:2018

18/30383935 DC:2018

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BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application

€23.00

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DIN EN IEC 60749-20-1:2018-11

DIN EN IEC 60749-20-1:2018-11

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Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat (IEC 47/2488/CDV:2018); German and English version prEN IEC 60749-20-1:2018

€150.65

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DIN EN IEC 60749-13:2018-10

DIN EN IEC 60749-13:2018-10

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Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (IEC 60749-13:2018); German version EN IEC 60749-13:2018.

€91.03

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NF EN IEC 62435-6, C96-435-6 (10/2018)

NF EN IEC 62435-6, C96-435-6 (10/2018)

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Composants électroniques - Stockage de longue durée des dispositifs électroniques à semiconducteurs Partie 6 : dispositifs encapsulés ou finis

€95.67

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NF EN IEC 62435-4, C96-435-4 (08/2018)

NF EN IEC 62435-4, C96-435-4 (08/2018)

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Electronic components - Long-term storage of electronic semiconductor devices - Part 4 : storage

€111.67

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18/30375624 DC:2018

18/30375624 DC:2018

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BS EN 60749-20-1. Semiconductor devices. Mechanical and climatic test methods Part 20-1. Handling, packing, labelling shipping of surface-mount devices sensitive to the combined effect moisture soldering heat

€23.00

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DIN EN IEC 60749-12:2018-07

DIN EN IEC 60749-12:2018-07

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Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (IEC 60749-12:2017); German version EN IEC 60749-12:2018.

€56.17

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BS EN 60191-4:2014+A1:2018

BS EN 60191-4:2014+A1:2018

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Mechanical standardization of semiconductor devices Coding system and classification into forms package outlines for device packages

€316.00

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