Standard Practice for Radiographic Examination of Semiconductors and Electronic Components
€72.00
Environmental testing Tests. Test M: Low air pressure
€193.00
Semiconductor devices sensors. Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature
€269.00
Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature
€176.00
Semiconductor devices. devices for energy harvesting and generation Test method measuring generated power from flexible thermoelectric
Electronic components - Long-term storage of electronic semiconductor devices - Part 7 : micro-electromechanical devices - Stockage de longue durée des composants électroniques - Partie 7 : Dispositifs microélectromécaniques
€111.67
Semiconductor devices. Mechanical and climatic test methods Resistance of plastic encapsulated SMDs to the combined effect moisture soldering heat
Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices
Semiconductor devices - Mechanical and climatic test methods - Part 20 : resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 20 : Résistances des CMS à boîtier plastique à l'effet combiné de l'humidité et de la chaleur de brasage
€126.00
Semiconductor devices. Mechanical and climatic test methods Preconditioning of non-hermetic surface mount devices prior to reliability testing
Semiconductor devices Optoelectronic devices. Photocouplers
€374.00
Semiconductor devices. Mechanical and climatic test methods Standard reliability testing of non-volatile memory devices
Semiconductor devices - Mechanical and climatic test methods - Part 15 : resistance to soldering temperature for through-hole mounted devices
€77.67
Semiconductor devices - Mechanical and climatic test methods - Part 30 : preconditioning of non-hermetic surface mount devices prior to reliability testing
€95.67
Semiconductor devices - Mechanical and climatic test methods - Part 41 : standard reliability testing methods of non-volatile memory devices
