31.080.01 : Semiconductor devices in general

BS EN 60191-6-22:2013

BS EN 60191-6-22:2013

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Mechanical standardization of semiconductor devices General rules for the preparation outline drawings surface mounted device packages. Design guide packages Silicon Fine-pitch Ball Grid Array and Land (S-FBGA S-FLGA)

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18/30375624 DC:2018

18/30375624 DC:2018

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BS EN 60749-20-1. Semiconductor devices. Mechanical and climatic test methods Part 20-1. Handling, packing, labelling shipping of surface-mount devices sensitive to the combined effect moisture soldering heat

€23.00

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BS IEC 60747-19-1:2019

BS IEC 60747-19-1:2019

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Semiconductor devices Smart sensors. Control scheme of smart sensors

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BS IEC 63068-3:2020

BS IEC 63068-3:2020

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Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Test method using photoluminescence

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18/30383935 DC:2018

18/30383935 DC:2018

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BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application

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BS IEC 62047-37:2020

BS IEC 62047-37:2020

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Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application

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BS IEC 63229:2021

BS IEC 63229:2021

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Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate

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BS IEC 63284:2022

BS IEC 63284:2022

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Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors

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BS EN IEC 63287-1:2021

BS EN IEC 63287-1:2021

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Semiconductor devices. Generic semiconductor qualification guidelines Guidelines for IC reliability

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BS EN IEC 60068-2-13:2021

BS EN IEC 60068-2-13:2021

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Environmental testing Tests. Test M: Low air pressure

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BS EN IEC 63244-1:2021

BS EN IEC 63244-1:2021

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Semiconductor devices. devices for wireless power transfer and charging General requirements specifications

€316.00

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BS EN IEC 60749-30:2020

BS EN IEC 60749-30:2020

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Semiconductor devices. Mechanical and climatic test methods Preconditioning of non-hermetic surface mount devices prior to reliability testing

€193.00

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BS EN IEC 60749-20:2020

BS EN IEC 60749-20:2020

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Semiconductor devices. Mechanical and climatic test methods Resistance of plastic encapsulated SMDs to the combined effect moisture soldering heat

€269.00

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BS EN IEC 60749-15:2020

BS EN IEC 60749-15:2020

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Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices

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BS EN IEC 60749-28:2022

BS EN IEC 60749-28:2022

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Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). level

€374.00

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