31.080.01 : Semiconductor devices in general

23/30472390 DC:2023

23/30472390 DC:2023

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BS EN 60747-16-11 Semiconductor devices Part 16-11. Microwave integrated circuits - Power detectors

€23.00

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IEC 63287-2:2023

IEC 63287-2:2023

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Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile

€88.00

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BS IEC 60747-18-4:2023

BS IEC 60747-18-4:2023

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Semiconductor devices bio sensors. Evaluation method of noise characteristics lens-free CMOS photonic array sensors

€193.00

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DIN EN IEC 60749-41:2023-03

DIN EN IEC 60749-41:2023-03

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Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (IEC 60749-41:2020); German version EN IEC 60749-41:2020

€111.40

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23/30469010 DC:2023

23/30469010 DC:2023

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BS EN IEC 63378-3. Thermal standardization on semiconductor packages Part 3. circuit simulation models of discrete for transient analysis

€23.00

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BS EN IEC 63364-1:2022

BS EN IEC 63364-1:2022

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Semiconductor devices. devices for IoT system Test method of sound variation detection

€193.00

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DIN EN IEC 60749-30:2023-02

DIN EN IEC 60749-30:2023-02

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Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2020); German version EN IEC 60749-30:2020.

€98.32

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BS IEC 62951-8:2023

BS IEC 62951-8:2023

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Semiconductor devices. Flexible and stretchable semiconductor devices Test method for stretchability, flexibility, stability of flexible resistive memory

€193.00

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NF EN IEC 63364-1, C96-364-1 (01/2023)

NF EN IEC 63364-1, C96-364-1 (01/2023)

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Dispositifs à semiconducteurs - Dispositifs à semiconducteurs pour système IDO - Partie 1 : méthode d’essai de détection de variation acoustique

€52.00

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BS IEC 62951-9:2022

BS IEC 62951-9:2022

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Semiconductor devices. Flexible and stretchable semiconductor devices Performance testing methods of one transistor resistor (1T1R) resistive memory cells

€193.00

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BS EN 61975:2010+A2:2022

BS EN 61975:2010+A2:2022

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High-voltage direct current (HVDC) installations. System tests

€404.00

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BS EN IEC 62007-1:2015+A1:2022

BS EN IEC 62007-1:2015+A1:2022

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Semiconductor optoelectronic devices for fibre optic system applications Specification template essential ratings and characteristics

€316.00

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BS EN IEC 60749-37:2022

BS EN IEC 60749-37:2022

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Semiconductor devices. Mechanical and climatic test methods Board level drop method using an accelerometer

€269.00

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BS IEC 63284:2022

BS IEC 63284:2022

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Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors

€193.00

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NF EN IEC 60749-37, C96-022-37 (11/2022)

NF EN IEC 60749-37, C96-022-37 (11/2022)

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Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 37 : Méthode d'essai de chute au niveau de la carte avec utilisation d'un accéléromètre

€82.00

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