Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
€165.00
Semiconductor devices. Mechanical and climatic test methods shock
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level
€355.00
Teleweb application Superteletext profile
€404.00
Mechanical standardization of semiconductor devices General rules for the preparation outline drawings surface mounted device packages Dimensions P-VSON
€193.00
Mechanical standardization of semiconductor devices. General rules for the preparation outline drawings surface mounted device packages Design guide 1,50 mm, 1,27 mm and 1,00 pitch ball column terminal
Reliability data handbook. Universal model for reliability prediction of electronics components, PCBs and equipment
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
€269.00
Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method
Semiconductor devices. Discrete devices Optoelectronic lasers
Semiconductor devices. Discrete devices Insulated-gate bipolar transistors (IGBTs)
€374.00
Mechanical standardization of semiconductor devices General rules for the preparation outline drawings surface mounted device packages. Design guide ball grid array (BGA)
Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices
Semiconductor devices Generic specification for discrete and integrated circuits
€316.00
Semiconductor devices Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
