Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life
€193.00
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 5 : essai continu de durée de vie sous température et humidité avec polarisation
€77.67
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
€44.00
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly (IEC 60749-10:2022); German version EN IEC 60749-10:2022.
€91.03
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 60749-37:2022); German version EN IEC 60749-37:2022.
€105.42
Technologies et dispositifs électroniques prêt-à-porter - Partie 401-1 : dispositifs et systèmes : éléments de fonctionnement - Méthode d'évaluation de la jauge de contrainte extensible de type résistif
€111.67
Dispositifs à semi-conducteurs - Méthodes d'essais mécaniques et climatiques - Partie 20-1: Manipulation, emballage, étiquetage et transport des composants pour montage en surface sensibles à l'effet combiné de l'humidité et de la chaleur de brasage
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Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification (IEC 63287-1:2021); German version EN IEC 63287-1:2021.
€145.14
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
€269.00
BS EN IEC 63287-3. Semiconductor devices. Generic semiconductor qualification guidelines Part 3. Guidelines for reliability plans power module
€23.00
BS EN IEC 62007-2. Semiconductor optoelectronic devices for fibre optic system applications Part 2. Measuring methods
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat (IEC 60749-20:2020); German version EN IEC 60749-20:2020.
€116.64
Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile
BS IEC 60747-5-4 AMD 1. Semiconductor devices Part 5-4. Optoelectronic devices. lasers
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
