31.080.01 : Semiconductor devices in general

IEC 61975:2010/AMD2:2022

IEC 61975:2010/AMD2:2022

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Amendment 2 - High-voltage direct current (HVDC) installations - System tests

€22.00

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IEC 61975:2010+AMD1:2016+AMD2:2022 Consolidated

IEC 61975:2010+AMD1:2016+AMD2:2022 Consolidated

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High-voltage direct current (HVDC) installations - System tests

€968.00

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IEC 60749-37:2022

IEC 60749-37:2022

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Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer

€176.00

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NF EN 62007-1/A1, C93-801-1/A1 (10/2022)

NF EN 62007-1/A1, C93-801-1/A1 (10/2022)

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Dispositifs optoélectroniques à semiconducteurs pour application dans les systèmes à fibres optiques - Partie 1 : Modèle de spécification relatif aux valeurs et caractéristiques essentielles

€59.33

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IEC 62007-1:2015/AMD1:2022

IEC 62007-1:2015/AMD1:2022

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Amendment 1 - Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics

€11.00

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IEC 62007-1:2015+AMD1:2022 Consolidated

IEC 62007-1:2015+AMD1:2022 Consolidated

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Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics

€506.00

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BS EN IEC 60749-28:2022

BS EN IEC 60749-28:2022

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Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). level

€374.00

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BS EN IEC 60749-10:2022

BS EN IEC 60749-10:2022

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Semiconductor devices. Mechanical and climatic test methods shock. device subassembly

€193.00

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BS IEC 60747-5-15:2022

BS IEC 60747-5-15:2022

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Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on electroreflectance spectroscopy

€183.00

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NF EN IEC 60749-10, C96-022-10 (06/2022)

NF EN IEC 60749-10, C96-022-10 (06/2022)

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Semiconductor devices - Mechanical and climatic test methods - Part 10 : Mechanical shock - device and subassembly

€65.33

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DIN EN IEC 60749-15:2022-05

DIN EN IEC 60749-15:2022-05

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Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices (IEC 60749-15:2020); German version EN IEC 60749-15:2020.

€77.20

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IEC 60747-5-4:2022

IEC 60747-5-4:2022

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Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers

€286.00

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IEC 60749-10:2022

IEC 60749-10:2022

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Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly

€88.00

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NF EN IEC 60749-28, C96-022-28 (04/2022)

NF EN IEC 60749-28, C96-022-28 (04/2022)

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Dispositifs à semiconducteurs - Méthodes d'essai mécaniques et climatiques - Partie 28 : Essai de sensibilité aux décharges électrostatiques (DES) - Modèle de dispositif chargé (CDM) - niveau du dispositif

€128.67

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22/30443678 DC:2022

22/30443678 DC:2022

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BS EN 60749-34-1. Semiconductor devices. Mechanical and climatic test methods Part 34-1. Power cycling for power semiconductor module

€23.00

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