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IEC 63287-2:2023
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
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Summary
IEC 63287-2:2023 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 03/29/2023 |
| Release Date | 03/29/2023 |
| Edition | 1 |
| Page Count | 30 |
| Themes | Quality assurance |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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