Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 60749-18:2019); German version EN IEC 60749-18:2019.
€111.40
Semiconductor devices bio sensors. Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
€269.00
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the internal quantum efficiency based on temperature-dependent electroluminescence
€193.00
EOS-Electrical Overstress in the Automotive Industry, Dealing with semiconductor devices showing a signature of electrial overstress, Contents, documentations and explanations 1st Edition, January 2020
€46.25
Composants pour parafoudres basse tension - Partie 322 : Principes de sélection et d'application pour les limiteurs de tension à jonction PN de semiconducteurs silicium
€125.00
Semiconductor devices Smart sensors. Control scheme of smart sensors
Semiconductor devices Discrete devices. Insulated-gate bipolar transistors (IGBTs)
€404.00
Semiconductor devices sensors. Performance evaluation methods for wearable glucose sensors
€316.00
Semiconductor devices - Part 9: Discrete devices - Insulated-gate bipolar transistors (IGBTs)
€418.00
Semiconductor devices - Part 14-10: Semiconductor sensors - Performance evaluation methods for wearable glucose sensors
€286.00
Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation Hardness Testing of Electronics
€94.00
Semiconductor devices Microwave integrated circuits. Frequency multipliers
Semiconductor devices. devices for energy harvesting and generation Test evaluation methods vertical contact mode triboelectric
Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
€325.00
Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
