Mechanical standardization of semiconductor devices - Part 4 : coding system and classification into forms of package outlines for semiconductor device packages
€95.67
Mechanical standardization of semiconductor devices General rules for the preparation outline drawings discrete
€316.00
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
€374.00
Semiconductor devices. Mechanical and climatic test methods Salt atmosphere
€193.00
Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency
€165.00
Amendment 20 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
€88.00
Semiconductor devices - Mechanical and climatic test methods - Part 13 : salt atmosphere
Amendment 1 - Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
€451.00
Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
Semiconductor devices - Mechanical and climatic test methods - Part 12 : vibration, variable frequency
€59.33
Normalisation mécanique des dispositifs à semi-conducteurs - Partie 1 : règles générales pour la préparation des dessins d'encombrement des dispositifs discrets
€117.00
Semiconductor devices - Mechanical and climatic test methods - Part 26 : electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
€141.33
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
IEEE Standard for Fault Accounting and Coverage Reporting(FACR) for Digital Modules
€55.00
