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IEC 60749-27:2006/AMD1:2012
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
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Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 09/25/2012 |
| Release Date | 09/25/2012 |
| Edition | 2 |
| Page Count | 5 |
| Themes | Quality assurance |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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