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DIN EN 62418:2010-12
Semiconductor devices - Metallization stress void test (IEC 62418:2010); German version EN 62418:2010
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Halbleiterbauelemente - Prüfverfahren zur Metallisierungs-Stressmigration (IEC 62418:2010); Deutsche Fassung EN 62418:2010
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 12/01/2010 |
| Page Count | 19 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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