Test method for measuring whisker growth on tin and tin alloy surface finishes
€269.00
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006); German version EN 60749-27:2006.
€77.20
Semiconductor devices. Mechanical and climatic test methods Measurement of moisture diffusivity water solubility in organic materials used for semiconductor components
€165.00
Semiconductor devices - Mechanical and climatic test methods - Part 39 : measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components - Dispositifs à semiconducteurs
€59.33
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 26 : essai de la sensibilité aux décharges électrostatiques (DES) - Modèle du corps humain (HBM)
€95.67
IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
€85.00
Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions (IEC 62047-1:2005); German version EN 62047-1:2006.
€105.42
Semiconductor devices. Micro-electromechanical devices Terms and definitions
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
€193.00
€231.00
Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS (IEC 47/1857/CD:2006)
€111.40
Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 1 : termes et définitions
€111.67
DC or AC supplied electronic control gear for LED modules - Performance requirements
€88.00
Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
€44.00
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
