31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
UNE-EN 60749-30:2005

UNE-EN 60749-30:2005

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

€66.00

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BS EN 62258-2:2005

BS EN 62258-2:2005

Superseded Historical

Semiconductor die products Exchange data formats

€374.00

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IEC 62047-1:2005

IEC 62047-1:2005

Superseded Historical

Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions

€176.00

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IEC 62258-1:2005

IEC 62258-1:2005

Superseded Historical

Semiconductor die products - Part 1: Requirements for procurement and use

€286.00

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IEC 60747-7-5:2005

IEC 60747-7-5:2005

Superseded Historical

Semiconductor devices - Discrete devices - Part 7-5: Bipolar transistors for power switching applications

€88.00

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IEC 62258-2:2005

IEC 62258-2:2005

Superseded Historical

Semiconductor die products - Part 2: Exchange data formats

€418.00

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IEC TR 62258-3:2005

IEC TR 62258-3:2005

Superseded Historical

Semiconductor die products - Part 3: Recommendations for good practice in handling, packing and storage

€325.00

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DIN EN 60749-30:2005-06

DIN EN 60749-30:2005-06

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2005); German version EN 60749-30:2005.

€77.20

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DIN EN 60749-21:2005-06

DIN EN 60749-21:2005-06

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (IEC 60749-21:2004); German version EN 60749-21:2005.

€98.32

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DIN IEC 60191-1:2005-06

DIN IEC 60191-1:2005-06

Superseded Historical

Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices (IEC 47D/607A/CD:2005)

€122.34

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NF EN 60749-30, C96-022-30 (06/2005)

NF EN 60749-30, C96-022-30 (06/2005)

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 30 : preconditioning of non-hermetic surface mount devices prior to reliability testing - Dispositifs à semiconducteurs

€77.67

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DIN EN 60749-26:2005-05

DIN EN 60749-26:2005-05

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (IEC 47/1803/CDV:2005); German version prEN 60749-26:2005

€77.20

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DIN EN 60749-27:2005-05

DIN EN 60749-27:2005-05

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 47/1804/CDV:2005); German version prEN 60749-27:2005

€77.20

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UNE-EN 60749-34:2005

UNE-EN 60749-34:2005

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling

€51.00

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DIN EN 60747-16-4:2005-03

DIN EN 60747-16-4:2005-03

Superseded Historical

Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches (IEC 60747-16-4:2004); German version EN 60747-16-4:2004.

€105.42

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