Discrete semiconductor devices - Part 8-4: Metal-oxide-semiconductor field-effect transistors (MOSFETs) for power switching applications
€418.00
Semiconductor devices - Discrete devices - Part 9: Insulated gate bipolar transistors (IGBTs) (IEC 47E/258/CD:2004)
€167.66
Bias-Temperature Stability Test for MOSFET (IEC 47/1763/CD:2004)
€91.03
Time Dependent Dielectric Breakdown Test (TDDB) (IEC 47/1764/CD:2004)
System tests for high-voltage direct current (HVDC) installations
€473.00
Reliability data handbook. Universal model for reliability prediction of electronics components, PCBs and equipment
€404.00
IEC TR 62380:2004 Reliability data handbook - Universal model for reliability prediction of electronics components, PCBs and equipment
Discrete semiconductor devices - Part 15: Isolated power semiconductor devices (IEC 60747-15:2003); German version EN 60747-15:2004.
€140.00
Microelectromechanical devices - Part 2: Tensile testing method of thin film materials (IEC 47/1759/CD:2004)
€69.91
Microelectromechanical devices - Part 3: Thin film standard test piece (IEC 47/1760/CD:2004)
€41.78
Semiconductor devices - Mechanical and climatic test methods -- Part 29: Latch-up test
€69.00
Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
€193.00
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 60749-29:2003); German version EN 60749-29:2003 + Corrigendum:2004.
€98.32
Semiconductor devices. Mechanical and climatic test methods Latch-up
€269.00
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
€165.00
