Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat (IEC 60749-20:2002 + Corr. 1:2003); German version EN 60749-20:2003.
€98.32
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced) (IEC 60749-32:2003 + Corr. 1:2003); German version EN 60749-32:2003 + Corr.:2003.
€41.78
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
€63.00
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
€36.00
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
€51.00
Semiconductor devices - Mechanical and climatic test methods -- Part 15: Resistance to soldering temperature for through-hole mounted devices
€41.00
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
€176.00
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 20 : résistance des CMS à boîtier plastique à l'effet combiné de l'humidité et de la chaleur de soudage
€111.67
Low-voltage fuses Supplementary requirements for fuse-links the protection of semiconductor devices
€316.00
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
€88.00
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength (IEC 60749-19:2003); German version EN 60749-19:2003 + Corrigendum 2003-06.
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices (IEC 60749-15:2003); German version EN 60749-15:2003.
€56.17
Semiconductor devices - Part 1: Microelectromechanical devices; Terms and definitions (IEC 47/1695A/CD:2003)
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 60749-18:2002); German version EN 60749-18:2003.
€77.20
