31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
DIN EN 60749-5:2003-09

DIN EN 60749-5:2003-09

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2003); German version EN 60749-5:2003.

€56.17

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DIN EN 60749-17:2003-09

DIN EN 60749-17:2003-09

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation (IEC 60749-17:2003); German version EN 60749-17:2003.

€41.78

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IEC 60749-22:2002/COR1:2003

IEC 60749-22:2002/COR1:2003

Superseded Historical

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength

€0.00

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IEC 60749-20:2002/COR1:2003

IEC 60749-20:2002/COR1:2003

Superseded Historical

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat

€0.00

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IEC 60749-10:2002/COR1:2003

IEC 60749-10:2002/COR1:2003

Superseded Historical

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock

€0.00

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IEC 60749-12:2002/COR1:2003

IEC 60749-12:2002/COR1:2003

Superseded Historical

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

€0.00

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IEC 60749-13:2002/COR1:2003

IEC 60749-13:2002/COR1:2003

Superseded Historical

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

€0.00

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IEC 60749-7:2002/COR1:2003

IEC 60749-7:2002/COR1:2003

Superseded Historical

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases

€0.00

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IEC 60749-3:2002/COR1:2003

IEC 60749-3:2002/COR1:2003

Superseded Historical

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination

€0.00

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IEC 60749-4:2002/COR1:2003

IEC 60749-4:2002/COR1:2003

Superseded Historical

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

€0.00

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IEC 60749-6:2002/COR1:2003

IEC 60749-6:2002/COR1:2003

Superseded Historical

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

€0.00

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IEC 60749-9:2002/COR1:2003

IEC 60749-9:2002/COR1:2003

Superseded Historical

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking

€0.00

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NF EN 60749-17, C96-022-17 (08/2003)

NF EN 60749-17, C96-022-17 (08/2003)

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 17 : neutron irradiation - Dispositifs à semiconducteurs

€59.33

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NF EN 60749-15, C96-022-15 (08/2003)

NF EN 60749-15, C96-022-15 (08/2003)

Superseded Historical

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 15 : résistance à la température de soudage pour dispositifs par trous traversants

€59.33

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BS EN 60749-20:2003

BS EN 60749-20:2003

Superseded Historical

Semiconductor devices. Mechanical and climatic test methods Resistance of plastic-encapsulated SMDs to the combined effect moisture soldering heat

€269.00

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