Superseded
Standard Corrigendum
Historical
IEC 60749-4:2002/COR1:2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
Preview
Summary
Modification of the validity date: now put at 2007.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 08/12/2003 |
| Release Date | 08/12/2003 |
| Cancellation Date | 03/03/2017 |
| Edition | 1 |
| Page Count | 0 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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