IEC 60749-10:2002/COR1:2003
Superseded Standard Corrigendum
Historical

IEC 60749-10:2002/COR1:2003

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
Most recent standard

Summary

Modification of the validity date: now put at 2007.

Technical characteristics

Publisher International Electrotechnical Commission (IEC)
Publication Date 08/13/2003
Release Date 08/13/2003
Cancellation Date 04/27/2022
Edition 1
Page Count 0
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