31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
NF EN 60749-18, C96-022-18 (05/2003)

NF EN 60749-18, C96-022-18 (05/2003)

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 18 : ionizing radiation (total dose) - Dispositifs à semiconducteurs

€95.67

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DIN EN 60749-3:2003-04

DIN EN 60749-3:2003-04

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual inspection (IEC 60749-3:2002); German version EN 60749-3:2002.

€34.30

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DIN EN 60749-4:2003-04

DIN EN 60749-4:2003-04

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (IEC 60749-4:2002); German version EN 60749-4:2002.

€56.17

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DIN EN 60749-6:2003-04

DIN EN 60749-6:2003-04

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 60749-6:2002); German version EN 60749-6:2003.

€41.78

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DIN EN 60749-9:2003-04

DIN EN 60749-9:2003-04

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking (IEC 60749-9:2002); German version EN 60749-9:2002.

€56.17

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DIN EN 60749-10:2003-04

DIN EN 60749-10:2003-04

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock (IEC 60749-10:2002); German version EN 60749-10:2002.

€41.78

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DIN EN 60749-12:2003-04

DIN EN 60749-12:2003-04

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (IEC 60749-12:2002); German version EN 60749-12:2002.

€41.78

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DIN EN 60749-13:2003-04

DIN EN 60749-13:2003-04

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (IEC 60749-13:2002); German version EN 60749-13:2002.

€56.17

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DIN EN 60749-7:2003-04

DIN EN 60749-7:2003-04

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (IEC 60749-7:2002); German version EN 60749-7:2002.

€56.17

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NF EN 60191-4/A2, C96-013-4/A2 (04/2003)

NF EN 60191-4/A2, C96-013-4/A2 (04/2003)

Superseded Historical

Mechanical standardization of semiconductor devices - Part 4 : coding system and classification into forms of package outlines for semiconductor device packages

€43.67

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IEC 61954:1999+AMD1:2003 Consolidated

IEC 61954:1999+AMD1:2003 Consolidated

Superseded Historical

Power electronics for electrical transmission and distribution systems - Testing of thyristor valves for static VAR compensators

€567.00

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IEC 60700-1:1998+AMD1:2003 Consolidated

IEC 60700-1:1998+AMD1:2003 Consolidated

Superseded Historical

Thyristor valves for high voltage direct current (HVDC) power transmission - Part 1: Electrical testing

€567.00

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UNE-EN 61643-341:2003

UNE-EN 61643-341:2003

Superseded Historical

Components for low-voltage surge protective devices - Part 341: Specification for thyristor surge suppressors (TSS)

€115.00

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UNE-EN 60191-4/A2:2003

UNE-EN 60191-4/A2:2003

Superseded Historical

Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages

€32.00

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IEC 60700-1:1998/AMD1:2003

IEC 60700-1:1998/AMD1:2003

Superseded Historical

Amendment 1 - Thyristor valves for high voltage direct current (HVDC) power transmission - Part 1: Electrical testing

€44.00

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