31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
UTE C96-317, C96-317U (11/1990)

UTE C96-317, C96-317U (11/1990)

Withdrawn Most Recent

Dispositifs hyperfréquences - Relais et commutateurs électromécaniques coaxiaux et en guides d'ondes - Recueil de spécifications particulières

€43.67

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UTE C96-318, C96-318U (01/1991)

UTE C96-318, C96-318U (01/1991)

Withdrawn Most Recent

Dispositifs hyperfréquences - Lignes à retard actives - Éléments entrant dans la définition des procédés technologiques pour l'agrément de savoir-faire et recueil de spécifications particulières

€95.67

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NF C86-818 (06/1983)

NF C86-818 (06/1983)

Withdrawn Most Recent

Composants électroniques - Système CENELEC d'assurance de la qualité - Diodes de redressement à température ambiante spécifiée - Spécification particulière cadre.

€56.33

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NF C86-811 (07/1983)

NF C86-811 (07/1983)

Withdrawn Most Recent

Composants électroniques - Système CENELEC d'assurance de la qualité - Thyristors à température de boîtier spécifiée - Spécification particulière cadre.

€59.33

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UTE C96-090, C96-090U (08/1989)

UTE C96-090, C96-090U (08/1989)

Withdrawn Most Recent

Composants électroniques - Dispositifs à semiconducteurs - Dispositifs discrets - Huitième partie : transistors à effet de champ - Section un - Spécification particulière cadre pour les transistors à effet de champ à grille unique, jusqu'à 5 W et 1 GHz

€95.67

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DIN IEC 62047-4:2006-09

DIN IEC 62047-4:2006-09

Superseded Historical

Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS (IEC 47/1857/CD:2006)

€111.40

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DIN IEC 60747-8:2007-06

DIN IEC 60747-8:2007-06

Withdrawn Most Recent

Semiconductor devices - Discrete devices - Part 8: Field-effect transistors (IEC 47E/320/CD:2007)

€190.65

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DIN IEC 60747-15:2007-06

DIN IEC 60747-15:2007-06

Superseded Historical

Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices (IEC 47E/322/CD:2007)

€122.34

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DIN IEC 62047-6:2007-07

DIN IEC 62047-6:2007-07

Superseded Historical

Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 47/1900/CD:2007)

€91.03

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DIN IEC 60747-14-5:2007-07

DIN IEC 60747-14-5:2007-07

Superseded Historical

Semiconductor devices - Discrete devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor (IEC 47E/326/CD:2007)

€69.91

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DIN IEC 62416:2007-08

DIN IEC 62416:2007-08

Superseded Historical

Hot Carrier Test on MOS Transistors (IEC 47/1902/CD:2007)

€63.27

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DIN EN IEC 63287-2:2024-10

DIN EN IEC 63287-2:2024-10

Active Most Recent

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile (IEC 63287-2:2023); German version EN IEC 63287-2:2023.

€98.32

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DIN IEC 60749-40:2009-06

DIN IEC 60749-40:2009-06

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge (IEC 47/2012/CD:2009)

€111.40

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DIN EN 60749-15:2009-06

DIN EN 60749-15:2009-06

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices (IEC 47/2014/CDV:2009); German version FprEN 60749-15:2009

€63.27

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DIN IEC 60747-1/A1:2009-08

DIN IEC 60747-1/A1:2009-08

Withdrawn Most Recent

Semiconductor devices - Part 1: General (IEC 47/2015A/CDV:2009)

€56.17

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