Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 47/1636/CD:2002)
€48.79
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance; Unbiased autoclave (IEC 47/1637/CD:2002)
Semiconductor devices - Discrete devices - Part 16-1: Microwave integrated circuits - Amplifiers (IEC 47E/264/CD:2004)
€98.32
Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for non-hermetic encapsulated electronic components (IEC 47/1769/CD:2004)
Semiconductors Product - Discontinuance notification for semiconductors (IEC 47/1777A/CDV:2004)
€41.78
Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors (IEC 47E/265/CD:2004)
€364.11
Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling, shipping and use of moisture/reflow sensitive surface mount devices (IEC 47/1775/CD:2004)
€111.40
Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches (IEC 60747-16-4:2004); German version EN 60747-16-4:2004.
€105.42
IEC 1964: Pin configuration for integrated circuit memory devices (IEC 47A/484/CDV:1997)
€84.58
Semiconductor discrete devices and integrated circuits - Part 7: Bipolar transistors (IEC 60747-7:1988 + A1:1988 + A2:1994)
€179.53
Blank detail specification - General purpose semiconductor diodes; German version EN 150001:1991
Blank detail specification - Case-rated bipolar transistors for low frequency amplification; German version EN 150003:1991
Blank detail specification - Bipolar transistors for switching applications; German version EN 150004:1991
€56.17
Blank detail specification - Variable capacitance diodes; German version EN 150006:1991
Blank detail specification - Case-rated bipolar transistors for high frequency amplification; German version EN 150007:1991
