Amendment 2 - Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
€11.00
Semiconductor devices - Part 16-1: Microwave integrated circuits; Amplifiers (IEC 60747-16-1:2001); German version EN 60747-16-1:2002.
€134.02
Composants et dispositifs actifs en fibres optiques - Normes de boîtier et d'interface - Partie 1 : généralités et lignes directrices
€59.33
Semiconductor devices. Discrete devices Recommendations for microwave diodes and transistors
€404.00
Mechanical standardization of semiconductor devices - Part 6-12: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for fine-pitch land grid array (FLGA) - Rectangular type
€127.00
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady state temperature humidity bias life test (IEC 47/1600/CDV:2002); German version prEN 60749-5:2002
€48.79
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (IEC 47/1591/CD:2001)
€84.58
Semiconductor devices - Mechanical and climatic test methods - General (IEC 47/1571/CDV:2001); German version prEN 60749-1:2001
€41.78
Dispositifs à semiconducteurs - Essais mécaniques et climatiques
€114.00
Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
€451.00
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices (IEC 47/1583/CDV:2001); German version prEN 60749-15:2001
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND) test (IEC 47/1584/CDV:2001); German version prEN 60749-16:2001
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation (IEC 47/1588/CDV:2001); German version prEN 60749-17:2001
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionising Radiation (total dose); Test procedure (IEC 47/1589/CDV:2001); German version prEN 60749-18:2001
€69.91
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength test (IEC 47/1590/CDV:2001); German version prEN 60749-19:2001
