Semiconductor devices; protections of electrostatic-sensitive devices (IEC 47(Secretariat)1330:1993)
€105.42
Electrostatic Discharge Sensitivity Testing - Transmission Line Pulse (TLP) - Component Level (IEC 47/2006/CDV:2008)
Semiconductor devices - Mechanical and climatic test methods (IEC 60749:1996); German version EN 60749:1999.
€116.64
Semiconductor devices - Recommendations for data sheets - Voltage reference and voltage regulator diodes
€24.39
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power Cycling (IEC 47/1648/CD:2002)
€48.79
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (IEC 60749-7:2002); German version EN 60749-7:2002.
€56.17
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing; Charged device model (CDM) (IEC 47/1658/CD:2002)
€63.27
Amendment to IEC 60747-2:1983 (IEC 47E/81/CDV:1997)
€41.78
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling (IEC 60749-34:2004); German version EN 60749-34:2004.
€69.91
Semiconductor devices - Discrete devices - Part 9: Insulated gate bipolar transistors (IGBTs) (IEC 47E/258/CD:2004)
€167.66
Bias-Temperature Stability Test for MOSFET (IEC 47/1763/CD:2004)
€91.03
Time Dependent Dielectric Breakdown Test (TDDB) (IEC 47/1764/CD:2004)
Dispositifs à semiconducteurs - Règles pour la gestion de la fin de vie des composants et pour leur remplacement (obsolescence des composants électroniques) - Prescriptions provisoires.
€30.50
Dispositifs à semiconducteurs - Règles pour la gestion de la fin de vie des composants et pour leur remplacement (obsolescence des composants électroniques). Prescriptions provisoires.
€34.00
