IEC 62047-22:2014 Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates
€46.00
IEC 62047-20:2014 Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
€389.00
IEC 60749-42:2014 Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
€23.00
IEC 62047-17:2015 Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films
€244.00
IEC 62047-16:2015 Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods
IEC 62007-1:2015 Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
€302.00
Semiconductor devices - Mechanical and climatic test methods (IEC 60749:1996 + A1:2000); German version EN 60749:1999 + A1:2000.
€140.00
Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices
€65.00
Standard Specification for Gold Wire for Semiconductor Lead Bonding (Withdrawn 2024)
This product is not for sale, please contact us for more information
Standard Practice for Radiographic Examination of Semiconductors and Electronic Components
€72.00
High-voltage direct current (HVDC) installations. System tests
€404.00
Standard Practice for Testing for Leaks Using the Halogen Leak Detector (Alkali-Ion Diode)
IEC 63378-6:2026 Thermal standardization on semiconductor packages - Part 6: Thermal resistance and capacitance model for transient temperature prediction at junction and measurement points
