Bias Life
€22.00
Moisture/reflow sensivity classification for nonhermetic solid state surface mount devices
€127.00
Acoustic microscopy for nonhermetic encapsulated electronic components
€88.00
A procedure for executing SWEAT
€176.00
Failure mechanisms and models for silicon semiconductor devices
€286.00
Guide for the standard probe pad sizes and layouts for wafer-level electrical testing
Standard method for measuring and using the temperature coefficient of resistance to determine the temperature of a metallization line
High temperature storage life
€11.00
Power and temperature cycling
Hermeticity
Semiconductor devices - Mechanical and climatic test methods
€99.00
Semiconductor devices - Part 14-1: Semiconductor sensors - General and classification
€44.00
Semiconductor devices. Discrete devices Microwave diodes and transistors. field effect Blank detail specification BDS for microwave field-effect transistors
€193.00
Preconditioning of nonhermetic surface mount devices prior to reliability testing
Mechanical standardization of semiconductor devices - Part 4 : coding system and classification into forms of package outlines for semiconductor device packages
€95.67
