Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (IEC 47/1591/CD:2001)
€84.58
Semiconductor devices - Mechanical and climatic test methods - General (IEC 47/1571/CDV:2001); German version prEN 60749-1:2001
€41.78
IEC 60747-16-9:2024 Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters
€302.00
IEC 60747-15:2024 Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices
€389.00
Dispositifs à semiconducteurs - Lignes directrices génériques concernant la qualification des semiconducteurs - Partie 3 : Lignes directrices pour les plans de qualification de la fiabilité des modules à semiconducteurs de puissance
€116.50
IEC 60747-4: Terminology, essential ratings and characteristics and measuring methods for integrated circuit microwave power amplifiers (IEC 47E/131/CDV:1999)
€63.27
IEC 60747-14-3: Discrete seminconductor devices - Part 14-3: Semiconductor pressure sensors (IEC 47E/132/CDV:1999)
€69.91
International Electrotechnical Vocabulary - Chapter 521: Semiconductor devices and integrated circuits (IEC 60050-521:1984 and IEC 1/1775/CDV:1999)
€134.02
Discrete semiconductor devices - Part 16-4: Terminology, essential ratings and characteristics, and measuring methods for integrated circuit microwave switches (IEC 47E/185/CD:2001)
€111.40
Static var compensators (SVC). Testing of thyristor valves
€374.00
Standard Specification for Gold Wire for Semiconductor Lead Bonding
€72.00
Harmonized system of quality assessment for electronic components. Generic specification: discrete pressure contact power semiconductor devices (qualification approval)
€269.00
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
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Test Method for Determining Carrier Density in Silicon Epitaxial Layers by Capacitance-Voltage Measurements on Fabricated Junction or Schottky Diodes (Withdrawn 2001)
Standard Test Method of Measurement of Common-Emitter D-C Current Gain of Junction Transistors
