Superseded
Standard
Historical
IEC PAS 62180:2000
Electrostatic discharge (ESD) sensitivity testing machine model (MM)
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Summary
Establishes a standard procedure for testing and classifying microcircuits according to their susceptibility to damage or degradation by exposure to a defined machine Model (MM) electrostatic discharge (ESD). The objective is to provide reliable, repeatable MM ESD test results so that accurate classifications can be performed.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 08/22/2000 |
| Release Date | 08/22/2000 |
| Cancellation Date | 10/21/2003 |
| Edition | 1 |
| Page Count | 12 |
| Themes | Quality assurance |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
22/08/2000
Superseded
Historical
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