Corrigendum 1 - Power electronics for electrical transmission and distribution systems - Testing of thyristor valves for static VAR compensators
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Data requirements for semiconductor die. Exchange data formats and dictionary exchange. DDX file format
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Data requirements for semiconductor die Mechanical, material and connectivity
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Data requirements for semiconductor die Vocabulary
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Standard Test Method of Measurement of Common-Emitter D-C Current Gain of Junction Transistors
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Standard Test Method of Measurement of Common-Emitter D-C Current Gain of Junction Transistors (Withdrawn 2011)
Dispositifs à semiconducteurs - Essais mécaniques et climatiques
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Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
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Environmental testing. Test methods Tests. M. Low air pressure
Environmental testing. Test methods Db and guidance: damp heat, cyclic (12 + 12 hour cycle)
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Power electronics for electrical transmission and distribution systems - Testing of thyristor valves for static VAR compensators
€325.00
IEEE Standard for Ferroresonant Voltage Regulators
€122.00
Amendment 2 - Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
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IEEE Standard for Definitions, Symbols, and Characterization of Floating Gate Memory Arrays
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