Standard Test Method for Measuring Transistor and Diode Leakage Currents (Withdrawn 2006)
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Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
Semiconductor devices. Discrete devices General
€374.00
Semiconductor devices - Discrete devices - Part 4-2: Microwave diodes and transistors - Integrated-circuit microwave amplifiers - Blank detail specification
€127.00
Amendment to IEC 60747-7: Bipolar transistors (IEC 47E/36A/CDV:1996)
€48.79
Amendment to IEC 60747-8: Field-effect transistors (IEC 47E/37/CDV:1996)
Semiconductor devices - Discrete devices and integrated circuits - Part 2: Rectifier diodes
€418.00
Data requirements for semiconductor die. Specific and recommendations Electrical simulation
€165.00
Data requirements for semiconductor die. Specific and recommendations Thermal
International Electrotechnical Vocabulary - Chapter 521: Semiconductor devices and integrated circuits (IEC 60050-521:1984 and IEC 1/1775/CDV:1999)
€134.02
Semiconductor devices - Mechanical and climatic test methods (IEC 60749:1996); German version EN 60749:1999.
€116.64
Data requirements for semiconductor die General
IEC 60747-4: Terminology, essential ratings and characteristics and measuring methods for integrated circuit microwave power amplifiers (IEC 47E/131/CDV:1999)
€63.27
IEC 60747-14-3: Discrete seminconductor devices - Part 14-3: Semiconductor pressure sensors (IEC 47E/132/CDV:1999)
€69.91
Amendment 1 - Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages
